IONOLUMINESCENCE
The new ionoluminescence (IL) apparatus has been recently installed at the microbeam facility of the 3 MV Tandetron accelerator of the INFN LABEC Laboratory in Florence and synergetically integrated into the existing set-up for Ion Beam Analysis.
Main characteristics of the IL apparatus:
Acquisition of the luminescence spectrum by means of a CCD spectrometer coupled through a bifurcated optical fiber to a collimating lens located at 10 cm from the sample and at 120° with respect to the beam direction.
Spectral range:: 200-900 nm; spectral resolution: 2 nm.
Panchromatic imaging was obtained facing directly the other leg of the Y shape optical fibre to a photomultiplier. Monochromatic IL imaging was obtained by selecting the wavelength through a linear variable filter (spectral resolution FWHM ~20 nm) interposed between the optical fibre end and the photocathode.
Effective scan area for IL imaging: 200 x 400 μm2.
IL activity
- PIXE-IL analysis of art objects
Raw lapis lazuli samples of different known origins and the precious lapis lazuli artworks of the Collezione Medicea of the Mineralogy and Lithology section of the Museum of Natural History, University of Florence; the aim of this study is to characterise their composition and provenience.

- IL analysis of advanced semiconductor materials.
IL spectra from a N doped diamond sample to be compared with cathodoluminescence spectra in order to evaluate the IL sensitivities and the effect of ion damage.
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E. Colombo, S. Calusi, R. Cossio, L. Giuntini, A. Lo Giudice, P. A. Mandò, C. Manfredotti, M. Massi, F.A. Mirto, E. Vittone,Recent developments of ion beam induced luminescence at the external scanning microbeam facility of the LABEC Laboratory in Florence,to be published in Nuclear Instruments and Methods in Physics Research B.
- S. Calusi, E. Colombo, L. Giuntini, A. Lo Giudice, P.A. Mandò, C. Manfredotti, M. Massi, G. Pratesi, E. Vittone, The new ionoluminescence apparatus at the LABEC external microbeam facility", to be published in Nuclear Instruments and Methods in Physics Research B.
Ion Beam Induced Charge Collection
The IBIC characterisation is mainly carried out at LABEC and at Laboratori Nazionali di Legnaro and at the Ruder Boskovic Institute of Zagreb (HR).
First experiments of IBIC characterisation of semiconductor devices from a focussed extracted beam have been carried out at LABEC laboratoy to evaluate the charge collection efficiency maps of 4H-SiC diode arrays and of CdTe/CdS thin film solar cells.
An example of such an activity is shown in the following figures. An array of 4 Schottky 4H-SiC diodes has been analysed by IBIC using a scanning a focused 3 MeV proton beam (spot size about 10 μm) extracted in air or in He atmosphere.
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The IBIC map highlight the presence of a linear defect underneath the electrodes and hence not visible at an optical inspection.
The characterisation activity carried out at the Laboratori Nazionali di Legnaro and at the Ruder Boskovic Institute of Zagreb (HR) is illustrated in the papers in the group web site